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Magnification of three-dimensional surfaces


At CIUS three-dimensional surfaces of objects are investigated with special scanning electron microscopes.

Two scanning electron microscopes, (REM) Philips XL 30 ESEM (pictured) and JEOL IT 300, are available at CIUS which guarantee high image quality with simple operation. Daniela Gruber explains how the nature of the sample determines the technique. [read more]